会议名称:International Conference on Colloid and Interface Chemistry(CIC 2020)
开始日期:2020-06-19
结束日期:2020-06-21
所在国家:China
所在城市:Xi'an
具体地点:China Xi'an
摘要截稿日期:2020-04-24
全文截稿日期:2020-04-24
联系电话:+86 15527426990
E-MAIL:paper_service@163.com
会议网站:http://www.marchconf.org/conference/CIC2020/
International Conference on Colloid and Interface Chemistry (CIC 2020) was planned to be held from March 27 to 29, 2020 in Xi'an, China. This Conference will cover issues on Colloid and Interface Chemistry. The aim for researchers, engineers, academicians as well as industrial professionals from all over the world to present their latest research results and advanced research methods.
CIC 2020 will be an important and reliable platform for inspiring international and interdisciplinary exchange at the forefront of Colloid and Interface Chemistry. The Conference will bring together academicians, engineers, educators and policy-makers from all over the world, and we hope that you will take this opportunity to join us for academic exchange and visit the city of Xi'an.
Topics: The conference is soliciting state-of-the-art research papers in the following areas of interest:
Colloidal chemistry
Thermodynamics and colloidal chemistry
Colloid and surface chemistry
Colloidal particles, nanoparticles and fluids
Soil colloidal chemistry
Colloid chemistry systems, emulsion science and technology
Colloidal chemistry in pharmacology and medical sciences
Colloid chemistry in advanced ceramics processing
The application of colloidal chemistry in industrial applications
Colloidal chemistry in environmental science and pollution treatment
Colloidal chemistry in biochemistry, biotechnology and bioengineering
Surface chemistry
Applied surface chemistry
Surface chemistry of nanobiomaterials
Nanoscale surface chemistry
Computational surface chemistry
Structure of solid surfaces
Adsorption of molecules on surfaces
The Langmuir isotherm
UHV and effects of gas pressure
Surface analytical techniques
Overlayer structures and surface diffraction
Surface imaging and depth profiling
Other Related Topics