International Conference on Colloid and Interface Chemistry(CIC 2020)

[基本信息]

会议名称:International Conference on Colloid and Interface Chemistry(CIC 2020)

开始日期:2020-06-19

结束日期:2020-06-21

所在国家:China

所在城市:Xi'an

[重要日期]

摘要截稿日期:2020-04-24

全文截稿日期:2020-04-24

[会务组联系方式]

联系电话:+86 15527426990

E-MAIL:paper_service@163.com

会议网站:http://www.marchconf.org/conference/CIC2020/

[会议背景介绍]

International Conference on Colloid and Interface Chemistry (CIC 2020) was planned to be held from March 27 to 29, 2020 in Xi'an, China. This Conference will cover issues on Colloid and Interface Chemistry. The aim for researchers, engineers, academicians as well as industrial professionals from all over the world to present their latest research results and advanced research methods.

CIC 2020 will be an important and reliable platform for inspiring international and interdisciplinary exchange at the forefront of Colloid and Interface Chemistry. The Conference will bring together academicians, engineers, educators and policy-makers from all over the world, and we hope that you will take this opportunity to join us for academic exchange and visit the city of Xi'an.

[征文范围及要求]

Topics: The conference is soliciting state-of-the-art research papers in the following areas of interest:

Colloidal chemistry

Thermodynamics and colloidal chemistry

Colloid and surface chemistry

Colloidal particles, nanoparticles and fluids

Soil colloidal chemistry

Colloid chemistry systems, emulsion science and technology

Colloidal chemistry in pharmacology and medical sciences

Colloid chemistry in advanced ceramics processing

The application of colloidal chemistry in industrial applications

Colloidal chemistry in environmental science and pollution treatment

Colloidal chemistry in biochemistry, biotechnology and bioengineering

Surface chemistry

Applied surface chemistry

Surface chemistry of nanobiomaterials

Nanoscale surface chemistry

Computational surface chemistry

Structure of solid surfaces

Adsorption of molecules on surfaces

The Langmuir isotherm

UHV and effects of gas pressure

Surface analytical techniques

Overlayer structures and surface diffraction

Surface imaging and depth profiling

Other Related Topics